基于像素周期结构的宽角阻抗匹配技术及其应用

    Wide-angle Impedance Matching Technology Based on Pixel Periodic Structures and Its Applications

    • 摘要: 制约平板相控阵天线宽视角扫描的主要有两大因素,分别是阵元在高俯仰角区域辐射投影不足与阵列在大角度范围出现阻抗失配,其中前者可以通过构造宽波束辐射阵元予以解决,而后者则难以消除且会引发增益快速下降甚至出现扫描盲点。为此,本文提出了基于像素周期结构的宽角阻抗匹配结构设计方法,用于改善阵列在大角度扫描时的阻抗失配现象,拓宽相控阵的有源阻抗匹配带宽。具体地,分别基于电磁参数乘积置负与表面波抑制机制,采用内部多端口法和非支配排序遗传算法实现并比较了两种像素结构的宽角阻抗匹配性能,并同时给出了一维与二维宽角度扫描相控阵天线设计的仿真与实验结果,验证了相关结论。仿真和实验结果表明,所设计的像素匹配层能有效改善一维和二维扫描下的有源波束扫描性能,如实现良好的阻抗匹配或降低扫描波束增益波动。

       

      Abstract: There are two main factors limiting the wide-angle scanning capability of planar phased array antennas, viz., insufficient radiation projection of array elements in high-elevation regions and impedance mismatch occurring at large scan angles. The former can be addressed by designing wide-beam radiating elements, while the latter is difficult to eliminate and leads to rapid gain degradation or even scan blindness. To address this issue, a wide-angle impedance matching structure design method based on pixelated periodic structures is proposed to improve impedance mismatch during large-angle scanning and broaden the active impedance matching bandwidth of phased arrays. Specifically, two pixelated structures were implemented and compared for their wide-angle impedance matching performance using the internal multi-port method and non-dominated sorting genetic algorithm, based on negative electromagnetic parameter products and surface wave suppression mechanisms respectively. Both one-dimensional (1-D) and two-dimensional (2-D) wide-angle scanning phased array antenna design cases and corresponding simulation and experimental results are presented to validate the conclusions. The designed pixel matching layer is ultimately proven effective for improving active beam scanning performance in both 1-D and 2-D scanning, such as optimizing impedance matching or reducing gain fluctuations of scanned beams.

       

    /

    返回文章
    返回