Abstract: By researching the reliability assurance technology of bare die,this paper puts forward a reliability assurance guideline of an integrated KGD(known good die)and a thorough technology process of the bare die design, production ,process control, reliability assessment, etc. A KGD standard line is established as the bare die reliability test standard. According to this KGD standard line, full frequency test and 3MHz aging test of the bare dies are conducted. Through tests, the reliability index of the KGD can be assured to fulfill the requirement of the IC packaging, and to realize the spaceborne electronic equipments with the bare die miniaturization , lightweight, high reliability and multi function , low cost finally.