Abstract: In order to improve the efficiency of research, development, testing and debugging of broadband microwave down-converters, the concept of generalized spurious response is adopted to establish the corresponding methods of automatic testing and analysis. According to this method, automatic test is conducted to construct spurious equations, and the spurious combination vector is solved to achieve the classification of spurs. In theory, this method is applicable to test multiple key indicators simultaneously, such as gain, image frequency suppression, intermediate frequency suppression, signal-related spurious,signal-independent spurious, and inter-modulation. To validate this method, it is adopted for the development of Kband broadband down-converter, with the corresponding hardware platform and software process explained in detail. As suggested by the analytical results, the proposed method is applicable to accurately analyze the spurious, thus improving the intelligence of the test. This is conducive to improving the performance of the down-converter and enhancing the efficiency of its development.